I have a CVD-prepared material. The problem is that the LASER covers a smaller area than the islands, so I see localized effects. Sometimes, the intensity of the silicon peak is larger than the sample, and sometimes, it is otherwise. How do I deal with this?
I really appreciate any help you can provide.
Fazla olan alanları çıkarın. Lazer için küçük alanlı parçacıklar üretin.
From a fundamental science aspect, localized effects are actually a pretty interesting thing with respect e.g. to film stress, so if your setup is a microscope capable of acquiring a map, you could actually convert it into a stress distribution analysis for your film.
Of course, with respect to establishing an industrial process in applied science, you try to get rid of that, but that's a point of CVD optimization, not of Raman processing.
Likely you're using a Raman microscope for your measurements. Try to use the lowest magnification objective, this should increase the spot size.
(In the limiting case, you could try to completely remove the objective (just unscrew it) and excite the sample with the unfocused beam. Though the collected signal could become very small in this case.)
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