The X-ray powder diffraction (XRD) pattern below for a tetragonal crystal system,
Use the provided X-ray wavelength for Cu Kα radiation, which is 1.5406 Å. Note that the Miller indices h, k, and l < 3 and the 100 and 010 planes are not present in the peaks.
Hi Nandagopal Vazhakkalil Swamimadam
I think you know the composition of the sample.
First, you find the JCPDS card that matches your sample by using X'pert Highscore software.
From that, you can index your peaks.
Further, you do refinement by using software like fullprof, etc.
If you do not know the composition it will be difficult to index your peaks as different compositional compounds will be obtained that match your sample. At least you need to know the composition of your sample.
Thank You.
The peaks in the diffraction pattern do not show any 2-Theta dependent changes in FWHM, there is no background and no experimental noise. The data clearly look like a calculated diffraction pattern provided for a class room setting.
Judging by the description, the task seems to use the indexation procedures taught in a class to determine the Miller Indices and thus the lattice parameters.
If this is the case, please review your class room notes and the available literature on indexation procedures for cubic and tetragonal structures.
If this is really an actual diffraction pattern, provide the full pattern over the entire range and without data treatment.
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