How to accurately determine the concentrations, especially low ones (0.1% to 5%), of Si and Al in solutions or in solids at a microscopic scale? As far as I know, except for XRF that need a larger amount of sample, colorimetry, AAS, SEM(TEM)-EDS, EPMA, ICP-MS and ICP-AES (ICP-OES) may be competent, but what should I do to improve the accuracy of these results? Thank you in advance for any inputs.
ICP-MS and AAS should give very low limit of detection.. To improve accuracy, sample preparation and digestion is critical (Nitric acid or microwave digestion). Standard addition would be a good idea to improve the accuracy since it will reduce matrix effect significantly.
Hi Peixin,
get reference samples that are accurately characterized. This will allow you to check your entire analytical procedure.
Sources for reference samples are:
https://fluxana.de/
http://www.breitlander.com/en/?M=030101
http://www.ccrl.us/
http://seishin-syoji.co.jp/en/products/standard/index.html
https://www.vdz-online.de/en/services/research-and-technology/chemistry-and-mineralogy/reference-materials/
https://www.ncbindia.com/new-certified-reference-materials-crms/index.html
Regards
Markus
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