Hello! What is the easiest way to calibrate the lateral force in AFM? I am using JPK Nano wizard AFM instrument. There are several methods in the literature. Can anyone suggest the easiest way to do it?
Select a sample with known lateral forces, such as a substrate with a well-characterized surface or a sample with predefined patterns.then Secure the chosen sample onto the AFM stage. Ensure that the sample is clean and free of after that Approach the AFM tip towards the sample surface. Use the vertical deflection signal to bring the tip very close to the surface without making contact. Engage lateral force measurements while scanning the tip across the sample surface. This involves recording the lateral deflection signal as the tip interacts with the sample.then Analyze the acquired lateral force data. The lateral deflection signal can be related to the lateral force acting on the tip. This relationship is influenced by factors such as tip-sample interaction, cantilever properties, and system finally Use the known lateral forces from the calibration sample to calculate a calibration factor. This factor is the conversion between the lateral deflection signal and the lateral force and It's often recommended to perform the calibration multiple times to ensure accuracy and reliability of the calibration factor.
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