SAED patterns can be used to determine lattice parameters by measuring the spacing between diffraction spots and relating them to the reciprocal lattice. The process involves identifying the zone axis of the SAED pattern, measuring the distances between spots, and using these measurements in conjunction with the wavelength of the electron beam and camera length to calculate interplanar spacings and ultimately, lattice parameters. Which software does this access, and does it have an SOP or procedure?
Hello, you may find some information here:
https://www.researchgate.net/post/How_measure_X_Y_co_ordinates_of_all_the_diffraction_spots_in_TEM_SAED_patterns
https://www.researchgate.net/post/Does_anyone_know_a_software_for_SAED_pattern_simulation
This is a very old topic, different programs are discussed.
Some software is commercial as discussed.
In the TEM lab (where the images ware taken) such software should exist, sometimes they have a stand-alone installation for customers.
If you are interested in a free software, look for demo or student versions.
One alternative is to analyze the SAED patterns in Digital Microsoft software (http://www.gatan.com/products/tem-analysis/gatan-microscopy-suite-software), using some of the user-defined scripts:
http://www.dmscripting.com/difftools.html
http://www.dmscripting.com/chtdiffractionanalysis.html
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