I use CdS in CIGS solar cells as buffer layer.
Is it possible to measure the sheet resistance of CdS thin film deposited on glass by CBD (50 nm) with 4-points probe? Or the probes will damage the layer and the measured sheet resistance is wrong?
Dear Zahra,
my recommendation is to use a Hall geometry. This is the best method to measure a sheet resistance. There is no special geometry necessary.
It is important:
a) no holes in the sample (here geometrical holes, not electrical holes)
b) Ohmic contacts
With Regard
R. Mitdank
Dear Zahra,
Furthe Rudiger' s suggestion, it is very difficult to use the four point probe to evaluate the sheet resistance of a semiconductor. The Hall effect measurement is the way to do it. Alternatively you could do a current-voltage of the sandwich structure of a semiconductor to analyse the sheet resistance.
Hope it helps.
Best wishes
Xuhua
- Badges
- Science topic