How to determine an exact excitation wavelength in PL measurement based on the UV-Visible absorption spectrum studies? How to interpret defects based on PL peaks in single crystals?
In order to determine an exact excitation wavelength in PL measurement it is desirable to measure the excitation spectrum. In the case of the absorption spectrum optimal wavelength of excitation corresponds to maximum of absorption spectrum as it shown in the attached picture. The absorption spectrum is shifted to shorter wavelengths relative to the maximum emission spectrum. This shift is named Stokes shift. Practically, in the case of study of semiconductor thin films it is necessary approximatly determine their band gap using absorption measurements. Then the photoluminescence spectrum is measured using the energy which is equal or more than the value of band gap.
Interpretation of defect structure using the photoluminescence structure spectra is same both single crystals and polycrystals. For example, you could be read our paper devoted to study of defect structure of polycrystalline CdTe and ZnTe thin films ( https://www.researchgate.net/publication/234073092_Low-temperature_photoluminescence_of_IIVI_films_obtained_by_close-spacedvacuum_sublimation?ev=prf_pub )
Article Low-temperature photoluminescence of II–VI films obtained by...