the scale you have attached to diffraction pattern is useless. You can find used camera lenght in the acquisition data of every image (check the camera software).
Do you know what kind of sample did you had? If you know the nature of your sample, then compare your diffraction pattern with slices of reciprocal space (diffraction patterns) typical for your material. Measure the reflection distances, their ratios, and angles. If you will be patient, you can find the match and you will be able to draw the true scale bar in reciprocal unit.
As mentioned by Mr. Girman, if you know the possible crystal structure of your sample, you can index the diffraction pattern by comparing the ratio of the g vectors and angle between the g vector in the diffraction pattern with the standard value. For example, if it is bcc structure, the possible zone axis is 012.
this is a steel specimen. A simple ratio between plane suggests it is a FCC pattern however i need more information to index the DP. I could not find any information in the camera software. However, i found camera lengths mention in TEM control panel when performing diffraction. Thus i was thinking to compare this diffraction pattern with a known camera length diffraction pattern.
be carreful, my suggestion about measuring of diffraction spots is not very precise method and might be applicable for monocrystal consisting of pure metal. In case of alloys the situation is difficult because diffraction spot will be shifted in dependence of composition. Moreover, diffraction pattern may be affected by ferromagnetism of steel sample, except for the autenitic structure (FCC).
The camera lenght indicated on microscope control panel may not be the exact camera lenght, so your calculation can be imprecise. If you have sure about camera lenght used for other diffraction pattern then compare it with image you posted.