sample are thin film coating on aluminum substrate.
can we use vectoer network analyzer for that.
There are many ways and instrument to do but what is the bandwidth you looking for, Is it civilian or military!!!. how thick is your coating? does it contain ferrite or conductive polymers!!
I do advice you to measure the electrical conductivity and the magnetic parameters first
I suggest the following paper,
http://pubs.acs.org/doi/abs/10.1021/am401695p
If you just concern with electrical characterization (conductivity) only, I do recommend using “4-point probe” approach for determine the I-V profile. 2-point probe approach may work just fine. Applying a dual sweep mode is optional. Operating within a voltage range −1 to 1 V, and 0.01 V stepwise, is recommended. Different ranges and steps may applied according to the sample futures and lectures. Measurements may carried out over five or three physical locations on each sample surface to confirm consistency within each sample. Each I−V measurement should be repeated five times at least for every location for reproducibility confirmation.
Important issues must be taking in consideration during measurements:
1. The probe must not penetrate the coating; hence, the measurements may represent the conductivity of aluminum substrate not the thin film coating.
2. It recommended sputtering gold contact points with a suitable musk to minimize or eliminate the contact resistance.
For this kind of electrical characterization (conductivity), I believe no need for vector network analyzer. Current−voltage (I−V) measurements may carried out via a Keithley 4200 SCS semi-conductor parameter analyzer or any alternative instruments.
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