I just wanted to identify the formation of mono layer of GO in aqueous solution using any techniques such as Raman, UV-Vis, etc....need good explanations.............
One of the best and straight forward method would be atomic force microscopy (AFM). The technique has nano scale resolution in topography measurements and layer thickness of GO flakes can be used to identify single layer flakes.
you can use SEM and TEM for identifying as well. In TEM graphene oxide doesn't even need the Lacey carbon as it is supported by the TEM grids so you can just put a drop and can identify the size and number of layers of Graphene pride formed. direct deposition has the advantage of producing large areas of graphene oxide supported film.
and in SEM you cam deposit the solution on the silicon stabs (given them the oxygen plasma treatment) and the graphene oxide will appear black in front of the white backgorund of the silicon dioxide. the number of sheets will be related to the GO suspension and the size of the sheets will be dependent on the source of the material.