(1) I have done some FC and ZFC measurements on my superconducting thin films of area 3 mm x3 mm and thickness 1.5 micron, deposited on Si substrates , what I get from the VSM on the y axis is magnetic moment (emu). How do I convert emu into emu/cm3. What is the significance of such conversion?
(2) How do I know if there is any effect of substrate on my data. Above Tc the data showed a straight line parallel to x-axis and intercepting the zero of the y - axis when extrapolated?
@ Roberto Koferstien
Thank you for the answer, I have a bit more doubt, how do I know the volume %age of the superconducting fraction (assuming that my samples are single crystalline)?
in order to get % superconducting fraction, you have to compare ZFC magnetic susceptibility of the sample with value (-1/4pi in Gaussian units), which is corresponds to full Meisner effect of ideal superconductor. Susceptibility is dimensionless, you'll get it dividing volume magnetization (emu/cm3) by magnetic field strength H (in Oe - Oersted) which was applied for ZFC.
It would be more accurate if you firstly (before dividing by volume of film) subtract magnetic moment of the substrate. It can be done as experimentally (to measure substrate before film deposition), so theoretically (if you know susceptibility of substrate material, multiply it by H and by volume of the substrate). Even if susceptibility of undoped Si is small, it could give a significant contribution if volume of substrate much bigger than that of the film.
More difficult (and possibly more important) to correct values by demagnetizing factor if your film was not in parallel with magnetic field during measurements (It can be neglected for a case of thin plane film is in parallel to field).
@ Gregory Leitus
Dear Gregory,
Thank you so much for helping me out with this, your answer has cleared all my doubt.
Thanking you.
Regards,
Dinesh
Hello,
I can know how to calculate the wave constant of spin D, I find the constant B but to calculate D I find a problem at the transformation level
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