Hello pandey,

You will observe the contact potential difference (cpd) of your tip and sample, which gives you information on work function. High and low cpd determines the doping of sample.

Well Thanks Surya Nalamati , I have done this part. I wanted to utilize the KPFM images and try to know effects of surface band structure on

the charge state of semiconductor surfaces or some other sort of things.

Hello Anand,

in addition to that, what Surya wrote, I send to you a tutorial. May be, it helps.

With Regard

R. Mitdank

Thanks Rüdiger Mitdank

I have measured Vcpd by KPFM but carrier concentration observed by Hall measurment and Vcpd does not show any relation

Hello Anand,

the attached paper gives information on how in detail such measurements must be carried out. Perhaps it helpes to find the cause for the difference. I would be interested in your findings because this method is new for me.

With Regard

R. Mitdank

Thanks Rüdiger Mitdank .