Both selected area electron diffraction (SAED) and XRD signals originate from the crystal structure of the material being investigated. Accordingly, they are related to each other. For example, each peak in XRD represents dot in the electron diffraction pattern. You can get d spacing and corresponding diffraction plane. They should match each other. Besides, SAED is an important material characterization technique, which provides the nature of the material such as single crystal, polycrystal, or amorphous.
Nesreen Yahia You're looking at an incredibly small amount of material in each case. It is a very useful exercise to see how much material is being 'characterized' by each technique. Local inhomogeneities are easy to invoke in order to explain differences. Many of us have seen systems where one indication is of amorphous material and another of crystalline. You need to take far more images in order to reach a more reasoned statistically significant conclusion.
in this the centre while hole denoted where the xray passes.
the outer ring like structure. in this both streaks and hole diffracted images are seen. the streaks indicates fine grain structure and hole indicates large grain structure. from that ring i guess the material is not fully crystalline.
Nesreen Yahia You have probably received all the necessary answers already. However, there are issues with the diffraction pattern you have taken: 1) Make sure your sample is actually in focus before switching to diffraction mode. 2) Adjust the camera length such that the rings fill a larger part of your screen (easier to evaluate and distinguish the ring distances). 3) Most importantly! You didn't use a beam stop to block off the central beam! You are potentially damaging the CCD camera of your department's TEM!!