I have X-ray data of Germanium thin films. I have calculated grain size using Scherrer eq. I have prepared an article. But referee said that my calculation is incorrect. Because I didn't eliminate instrumental broadening. How can I eliminate this effect?
Dear Sir,
the very same issue is already discussed in detail in RG. For details, see the question
How to determine the "broadening effect factor" of an XRD equipment in measuring grain size of materials?
by Van-Cuong Nguyen. Over there, the answer by Matteo Leoni should be a good starting point.
Sincerely, FM
This broadening could be automatically substracted by JADE program. However, you should confirm the grain sizes by SEM or TEM to get a high quality manuscript.
You should be able to compute instrumental broadening effects using a standard. Try using LaB6 first and see how your profiles come up. You should then be able to use refinement softwares such as fullprof to compute the instrumental parameters. Once you have these parameters, then you should be able to quantify the broadening effects on the peak. Using scherer's equation just gives you particle size information, but due to axial divergence of your incoming photon beam or asymmetry effects the features of the peaks changes. If you are using Reflection mode for example it's even more complicated as you have to factor in special asymmetry issues.
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