I synthesized ZnO CuO composite particles and obtained its EDX spectrum. from the EDX specrum Oxygen vacancies can be determined. if it is possible how. please help me. thank you?
Dear Ali, the EDX gives you the element of your component, I recommend that the XPS can give you the concentration of O vacancies. From XPS spectra , you can study the oxidation of your component then it is easy to calculate the vacancies ratio. Regards
Dear Ali...first of all you will get little excess of oxygen in EDX analysis, whether its contaminant or errors from the analysis...as many suggested you to do XPS, that will again give you of surface analysis (~10nm)...if your thickness in that range would be perfect...so now if you have data from XPS and EDX, compare the atomic ratio (Zn/O or Cu/O) for both...do some PL (photoluminescence) or CL (cathodoluminescence) study to know more about the film property...
I think using XPS spectrum analysis is the best choice for you. Specifically the XPS deconvolution of Oxygen peaks will let you know all types of oxygen bindings .EDX will not be helpful for you to determine the vacancies and defects .
You can calculate Zn% and %O (atomic percent) in a specific area by the EDS method. Also, you can use SEM-EDS elemental mapping for your samples. Just like the attached image link https://images.app.goo.gl/QKM2nR15R7yCLXC16
Oxygen vacancies cannot be calculated by EDX. Since the technique is most suitable for the (composition) analysis of element which has high atomic number (ie., lighter elements are not preferred Z