If you have a SEM with microanalysis you can try with EDS  

Dear Babar,

Identification of elemental composition of sample by EDX technique can give you the percentage of each atom in the doped composite

SEM along with EDX provide a clear picture on the morphology and the composition of the composite.

Energy-dispersive X-ray spectroscopy (EDS, EDX, or XEDS), sometimes called energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing unique set of peaks on its X-ray emission spectrum.

Joseph Goldstein (2003). Scanning Electron Microscopy and X-Ray Microanalysis. Springer. ISBN 978-0-306-47292-3.

https://en.wikipedia.org/wiki/Energy-dispersive_X-ray_spectroscopy

Hoping this will be helpful,

Rafik.

ICP is a better choice than EDS with higher resoluntion.

could you observe any peak broadening/intensity variation as compared to the pristine one.

Better find bond length/ unit cell volume  of both the sample.

If you find any variation, your dopant ie therein sample