I synthesized reduced graphene oxide and used AFM for thickness measurement but it shows non-uniform thickness. How can I calculate the thickness using XRD?
Determination of non-uniform graphene thickness on SiC (0 0 0 1) by X-ray diffraction
Applied Surface Science Volume 282, 1 October 2013, Pages 297–301
This paper investigated thickness of graphene films on Si-terminated SiC by X-ray diffraction (XRD).•
give the accurate thickness distribution for non-uniform graphene layers which cover the substrate.
Thank you Prof. Shen-Ming Chen i want thickness of reduced GO on Si not silicon carbide. This approach is, therefore, suitable for the sample on which at least 1
carbon layer (buffer layer) covers the whole area shone by an X-ray
beam. Also using this method, In this report, an X-ray diffraction (XRD) pattern around agraphene peak was used for layer number distribution determination
of non-uniform graphene layers on SiC substrate. The XRD pattern was analyzed by using a simple equation and few numbers of parameters (such as layer spacing and layer coverage of graphene film).
I think this method can calculate only interspacing distance dj and occupancy beeta.
https://www.uvsor.ims.ac.jp/paper/2013/A.%20Ruammaitree282_2013_297.pdf
I don't understand how thickness can be calculated?
Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering... (Dr. Scott Speakman) - Panalytical
https://www.youtube.com/watch?v=wkusJqpLPMo
https://www.researchgate.net/post/What_is_the_best_way_to_interpret_REAL_TIME_3D_X_Y_o-2TH_o_ph_ch_reciprocal_space_relative_intensity_data_from_HRXRD_rocking_curve_analyses
I am assuming that You are talking about Interlayer spacing d, between GO sheets. If that's the case, easiest way is, You can use 2theta Value of Your XRD GO peak and apply Brag's equation. nΔ=2dSin(theta). To get d, Substitute x ray wavelength Used for xrd(Δ) and theta (GO peak 2theta value/2).
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