I synthesized reduced graphene oxide and used AFM for thickness measurement but it shows non-uniform thickness. How can I calculate the thickness using XRD?
Determination of non-uniform graphene thickness on SiC (0 0 0 1) by X-ray diffraction
Applied Surface Science Volume 282, 1 October 2013, Pages 297–301
This paper investigated thickness of graphene films on Si-terminated SiC by X-ray diffraction (XRD).•
give the accurate thickness distribution for non-uniform graphene layers which cover the substrate.
Thank you Prof. Shen-Ming Chen i want thickness of reduced GO on Si not silicon carbide. This approach is, therefore, suitable for the sample on which at least 1
carbon layer (buffer layer) covers the whole area shone by an X-ray
beam. Also using this method, In this report, an X-ray diffraction (XRD) pattern around agraphene peak was used for layer number distribution determination
of non-uniform graphene layers on SiC substrate. The XRD pattern was analyzed by using a simple equation and few numbers of parameters (such as layer spacing and layer coverage of graphene film).
I think this method can calculate only interspacing distance dj and occupancy beeta.
https://www.uvsor.ims.ac.jp/paper/2013/A.%20Ruammaitree282_2013_297.pdf
I don't understand how thickness can be calculated?
Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering... (Dr. Scott Speakman) - Panalytical
https://www.youtube.com/watch?v=wkusJqpLPMo
https://www.researchgate.net/post/What_is_the_best_way_to_interpret_REAL_TIME_3D_X_Y_o-2TH_o_ph_ch_reciprocal_space_relative_intensity_data_from_HRXRD_rocking_curve_analyses
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