From my opinion there is a general misunderstanding. HR-TEM images are also "available" for any other lattice planes, the problem is only that the distances are so small that you cannot see the actual planes that clearly anymore. Therefore, one selects intentionally a presentation which shows the best images and these are planes where the atomic layers are at least still visible, i.e. planes with the biggest distance. But if planes parallel (111) can be depicted, then every other plane exists but does not deliver clear images anymore. Draw a projection of (311) by yourself and you will see that you very likely don't see the planes that clearly anymore since the size of your atoms becomes more and more bigger compared to the plane or even layer distance . 

Your entire question is a bit confuse: you are mixing a lot of terms which do not match at all:

"...for example some lattice planes (111),( 311).. of single crystal  silicon nano particle appear in x-ray diffraction and electron diffraction...."

In XRD and electron diffraction you don't see the lattice planes (which are mathematical abstrations!!!). You only see the interferences of these lattice planes which define the periodicity of the structure described by the vector lattice.

"...but in HRTEM only appear and we see single grain that has (111) plane ,why?..."  

Also wrong. In HR-TEM you don't see the lattice planes but in maximum atomic layers parallel to the lattice planes...and only for very simple crystal structures...

(hkl) lattice plane of a sample that measured in x-ray diffraction or electron diffraction is the same plane of grain that appears in HR-TEM? 

In principle the diffraction patterns of a material is the same independently of the used radiation (X-rays, electrons, neutrons ...). However the observed diffractions depend on their intesity and that depends also from the type of radiation. One should also take into account the preferential orientation that can reinforce some diffractions and prevent some others.

Dear Diman M .A

Peace be upon you

In fact  XRD is completely differ from SEM Or TEM. 

SEM: this technique will give you information about the structure of the surface of the material you are studying. This is because the image that you see on the screen is formed from the electrons that 'rebound' (let me use this non scientific word) on the surface of the material you are studying.

TEM: in this case you will also have information about the structure of your material. In this case, you receive information about that structure from the electrons that pass through your sample, so the image in the screen is formed from the electrons that pass through the sample.

X-ray: while SEM and TEM give you information about the structure of the material, an X-ray analysis gives information about the crystallographic structure, so you can determine if the material is amorphous or not, If it is not, you can determine its microstructure, where you can determine accurately the lattice parameters of the unit cell.

While SEM or TEM see some defined area chosen by the technician. 

Good luck

Dear Dr.Ahmed 

Thank you very much to answer my question. 

may be my question doesn't  so clear .I attach this paper for more explanation.

If you look at fig1(a) we see diffraction pattern (111).(220)and (311),plane but in fig1(b) only lattice plane (111) appears in HRTEM image my question is what about planes (220) and (311)? 

Dear Diman M.A., in the inset of Fig 1(a) I see a diffraction pattern; in fig. 1 (b) I see a HRTEN image showing a family of lattice planes (111, you say). My explanation is that the HRTEM image has been obtained using only the 111 diffraction and screening the other diffractions.

Dear professor Giovanni

your explanation is right but I said why the other planes don't appear in HRETM?

Because the HRTEM image has been obtained using the interference of the incident beam with the 111 diffracted beam only (as alredy I said before)

Dear Dr Diman M .A

Peace be upon you

X-ray diffraction can investigate the crystal structure of the material. When It incident on the material a diffraction pattern will be obtained and the diffraction planes can be observed especially when the material is rotated (different planes are corresponding to different diffraction angles). Hence the different planes can be depicted for the unit cell of defined crystallite size of the investigated material.

In SEM the investigated is neither a unit cell nor crystallite size but it is an agglomeration of many crystallite size so the formed image will be belonged to the surface of the sample and therefore all the planes will not appear (except the plane that is normal to the incident X-ray).

I hope this help you

Good luck

From my opinion there is a general misunderstanding. HR-TEM images are also "available" for any other lattice planes, the problem is only that the distances are so small that you cannot see the actual planes that clearly anymore. Therefore, one selects intentionally a presentation which shows the best images and these are planes where the atomic layers are at least still visible, i.e. planes with the biggest distance. But if planes parallel (111) can be depicted, then every other plane exists but does not deliver clear images anymore. Draw a projection of (311) by yourself and you will see that you very likely don't see the planes that clearly anymore since the size of your atoms becomes more and more bigger compared to the plane or even layer distance . 

Your entire question is a bit confuse: you are mixing a lot of terms which do not match at all:

"...for example some lattice planes (111),( 311).. of single crystal  silicon nano particle appear in x-ray diffraction and electron diffraction...."

In XRD and electron diffraction you don't see the lattice planes (which are mathematical abstrations!!!). You only see the interferences of these lattice planes which define the periodicity of the structure described by the vector lattice.

"...but in HRTEM only appear and we see single grain that has (111) plane ,why?..."  

Also wrong. In HR-TEM you don't see the lattice planes but in maximum atomic layers parallel to the lattice planes...and only for very simple crystal structures...

(hkl) lattice plane of a sample that measured in x-ray diffraction or electron diffraction is the same plane of grain that appears in HR-TEM? 

Thank you so much Mr.Nolze,your answer is very important for me.

I am sorry if the explanation of my question doesn't clear.I know as (hkl) index increase the d-spacing becomes very small .but I didn't understand why like in this article they only indicated (111) plane I didn't know where are the other planes in HRTEM.

If you look at the fig1(a) and fig1(b) you see the meaning of my question.

.

The (111) are the "horizontal" lines. If you want see other planes you need to tilt the sample by usually two unknown angles.