I want to identify the composition of very low concentration and very limited sample. Which analysis is more sensitive to detect the element in the sample?
WDXRF or EDXRF can be used only for elemental quantification down to ppm or even for heavy elements at sub-ppm levels depending on the sample matrix as well as instrument configuration. From XRD you get the mineralogy...and both data from EDX and XRD are complementary.
However, if by EDX you mean SEM-EDX then the minimum you can detect should be ~ 0.1% level.
WDXRF or EDXRF can be used only for elemental quantification down to ppm or even for heavy elements at sub-ppm levels depending on the sample matrix as well as instrument configuration. From XRD you get the mineralogy...and both data from EDX and XRD are complementary.
However, if by EDX you mean SEM-EDX then the minimum you can detect should be ~ 0.1% level.
To be more precise:
With XRF you can get the total metal/element (Na-U usually) in whatever chemical/physical form/state they are in the sample. But, with XRD you should get the crystalline components of the sample only.
You did not mention how low you want to detect, and whether you can destroy your sample or not. What's the quantity of your sample? If its non-destructive you want then I guess you have to use XRF. If the sample amount is in micro-gm I am afraid you may have to choose a micro-XRF (or even a Synchrotron micro-XRF facility) to get very low concentrations of constituent elements.
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