While performing X-Ray diffraction measurement, which of the following is true
(1) the diffraction from only a point structure on the sample is characterized
(2) diffraction from an area is characterized.
Depends on the instrument that you use. Simple laboratory diffractometers have spot size around 1x1 cm, while best microdiffraction beamlines can give a spot smaller than 1x1 µm.
What do you mean by point structure?
It is depend firstly on the method you adopt to record the XRD spectra such as laue, powder or rotating crystal
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