hi,

which angle you measuring? si or fi

how about your device? is it have a goniometer?

fi angle is important to calculate. if your cathode tube have a filter. under 60 and maximum peak is good and no problem on your measuring.

if dont have filter you must use about 60 degree angel.

si angle need for better results.

is your device calibrate?

to get more information read book of sir fitzpatrik. he has agood book to guidance x-ray measuring.

this file i upload is a best refrence to use and get you information.

That make sense since the measured stress depends of the hkl planes

Regards,

Pedro

Thanks Mr. Pedro. Could you please explain a little more

hi

as i know hkl is arrow of crystalization. it seems that change the your crystalzation plane change your parameters.

thats true. but not for this. its one of many reasones.

stress change when your atomic distance change.

x ray shows you the diffrent of the martial whithout stress against the matial from change strain on it.

strees= d1-d0/ E

d mean atomic distance

E= young madulus

when your angles change that results maybe your crystalization plan change but 50 Mpa is very big for this.

i dont know exactly what change on your duties. that guidance show you more information.

that is i know about this methode.