Sorry,but this is not my area of study

Good morning, Professor Dr Ahmed Hassanien 

The Dr. Norma Míngolo works in XRD in CNEA Comisión Nacional de Energía Atómica (Atomic National Comisión in Argentina).

The Dra. Norma´s mail is:

mingolo @cnea.gov.ar

Zulema Ángela Mahmud 

mail is [email protected]

                  [email protected]

Salam Doctor Hassanien

You need to put stress on your crystal and measure the shift in the Diffraction peak in different planes. Use Kittel Book on solid state physics where he describes the calculation of a cubic crystal 

Dear Dr. Zulema Ángela Mahmud 

May Allah Bless You

Thank you for your attention and giving me the email addresses of you and Dr. Norma. 

You are the most welcome Doctor Zulema Mahmud.

With my best wishes and good luck

Salam Dr. Ángela

May be this reference can help you:

Uniaxial stress component in WC toroidal anvils under high pressure and temperature

P. Grima et al. Phys. Stat. Sol. (a) Vol. 180, 427 (2000)

Best regards,

Pedro

Thank You very much Prof. P. Grima Gallardo  for your attention.

Prof.Ahmed Saeed Hassanien,

Please refer to the following papers: Singh et al, Phys. Rev. Lett. 80, 2157-2160 (1998); Singh et al, J. Appl. Phys. 83, 7567-7575 (1998); Teeuw and, DE Hosson, J. Mater. Res. 13, 1757-1760 (1998), and a few other papers in the literature. These articles give elaborate method to determine elastic constants not only of solids of the cubic systems but also of solids of lower symmetry. Essentially load is applied and the strains produced are measured by the shift of the x-ray diffraction lines. I hope this will be of some help.

Anil K. Singh

Dear Prof. Anil K. Singh 

Thank you very much for your attention and suggesting these papers. But I don't have the access to download them.

Thank you

Yours,

Ahmed 

My paper: Singh et al, Phys. Rev. Lett. 80, 2157-2160 (1998); Singh et al, J. Appl. Phys. 83, 7567-7575 (1998) can be downloaded from my home page. For your convenience, I have attached my papers. I am not sure about the third paper if it available on ResearchGate.

Thank You.

🌹🌹🌹 Thank you very much Prof. Anil K. Singh, for your sharing these valuable papers.

Thanks

Dear Dr. Hassanien

For nanomaterials, X-ray peak profile analysis (XPPA) is a good tool to estimate the microstructural quantities and correlate them with the observed material properties. XPPA is an averaging method and a powerful tool to estimate the crystallite size and lattice strain.

There are many publications to calculate the elastic moduli  (Young's modulus) in cubic system using XRD data (below link).

http://www.sciencedirect.com/science/article/pii/S0925838816308337

https://link.springer.com/article/10.1007/s00339-016-0293-3

Also, I attach Excel data that I used to caculate the the elastic moduli in a cubic system (MgO nanopartilces).

best regards

Sadegh yousefi ([email protected])

young modules

Thanks a lot for Prof. Hassanien for his request and very thanks for Dr. Anil K. Singh for sharing his valuable papers.

Regards

It is my pleasure to discuss these topics.

Thank you.

Possible correspondence d. Sihama Issa at the University of Technology in Iraq Department of Materials Engineering

Dear Dr. Waleed

Greeting

I don't understand your previous comment. Please clarify what you mean!

Who is d. Sihama Issa and how can I contact him/here?

Thanks