Hi,

I am measuring the room temperature X-ray diffraction data of the Sr and Co doped LaFeO3 powder. I am observing the background intensity of the XRD pattern is gradually increasing at the higher 2theta. Please see the attached image. Is this background is coming from the instrument or the sample itself? Could you please let me know the reason of this behavior? I measured the XRD on glass, which has signal at the lower angle. Is there any way to avoid it and fitting of the data? I am looking forward to hearing from you. Any suggestions will be highly appreciated.

Thanks,

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