Can we study the dielectric properties of thin film (thickness in nano-meter) by coaxial probe method?

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Venkata Ramana Mudinepalli

Dear Das,

Yes, we can study the dielectric properties of thin film by coaxial probe method.

Please read some old literature on this method.

I wish you good luck.

Ujjal Das

Dear Sir,

Can you please share link of few article on this, where the method have been applied for thin film having thickness in nanometer or micrometer.