I have 3 substrates
p-si (0.001-0.01 ohm cm), n-si (1-10 ohm cm) and glass.
When I use si wafer as a substrate during RF sputtering I have noticed that the edges are not coated and coating is near the center part of the substrate. I cannot give any tape for thickness measurement also. Will this problem be in case of glass substrates too. Is it possible to bias a glass substrate?