I am going to use 3D profilometer to measure the surface roughness, but struggling how to set up the backscan and length. The surface roughness seemed to be varied a lot with different backscan and length. We already know the definitions for both parameters, but not clear what references need to be considered for set up. Thanks
Dear Bingxu Wang,
You are talking about the focus stage for optical profilometer. Make sure that the peak of the sample within (2mm) from Turret. Try to adjust the z-axis until you see the fringes on the screen. Dont forget the thickness of the sample can affect the focusing point.
Take this trick: once you start up scanning try to vibrate the sample by hit the table, to get accurate scanning.
Best regards
The answer to this question should be in the user manual of the device.
We have a Bruker Contour Interferometric Surface Profiler in our facility, the James Watt Nanofabrication Centre.
What you have to do is focus on the highest point of your sample. This is where intimate knowledge of your sample topography is essential. The backscan and scan lengths should be in relation to the highest sample point.
What is also important is parameters like modulation threshold. In layman's terms this is a threshold level below which the measured data will be disregarded.
Dear Bingxu Wang,
You are talking about the focus stage for optical profilometer. Make sure that the peak of the sample within (2mm) from Turret. Try to adjust the z-axis until you see the fringes on the screen. Dont forget the thickness of the sample can affect the focusing point.
Take this trick: once you start up scanning try to vibrate the sample by hit the table, to get accurate scanning.
Best regards
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