It would be most interesting for us to compare and fit the X-ray results of periodic multilayers at low (x-ray reflectivity) and high (x-ray diffraction, including satellites) angles simultaneously with one single program.
If there is no such program around for both ranges of diffraction angles, it would be also helpful to know a program for high angles which includes the sattellite reflections of multilayers according to the step model of Segmüller and Blakeslee (or similar).
Hallo Hans, LEPTOS From Bruker is doing the job. For more details contact me at [email protected]
Hello Hans,
You can try using Gen X for doing the XRR fittings .. its a nice software but needs some getting used to .. otherwise u can try XRR software from Panalytical .. If u can send me the raw data for XRR and the material parameters eg density, roughness and expected thickness i can try to do the fitting for u .. i have software for pendellosung fittings but for single layers not multilayers ..
Hallo Hans, LEPTOS From Bruker is doing the job. For more details contact me at [email protected]
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