1)The image suggested crystalline nature of synthesized materials. if spots are in your pattern , indicates that the material is crystalline.

2) In the image the curlicues are clearly visible.

3) If one or two spots face each other suggested the plane of crystals and atoms.

4) you can from the central spot to each edge to measure the distance for studying a particular plane so on.

This link may be helpful to you:

https://code.google.com/archive/p/diffraction-ring-profiler/wikis/howtoscreenshots.wiki 

The attached pdf may help you in better understanding of the various physico-chemical techniques employed in characterization of Materials.

Distance between two bright spots (D) = 2 × Radius of that circle

The distance is in reciprocal space so we take inverse to convert it into real space

Thus, the formula for Interplanar spacing (d):

Interplanar spacing (d) = 2 / Distance between two bright spots

What is your sample? Do you know chemical composition of the area where you obtained the SAED pattern?

My sample is ZnO nanoparticles

Thanks Manesh and Gourab sir

It seems that you have a mixture ZnS and ZnO2.

I recommend you to do X-ray EDS to be sure.

Best regards

Elena

PS. green lines are ZnS hex and red lines are ZnO2 cub

Yes Elena, but most of the reflections could also be solved for ZnO - zincite with wurtzite structure. Of course the quality of the d-value measurements strongly denends on how well the camera is calibrated...

To OP: I suggest using original .dm3 file (probably this image was converted in Digital Micrograph), where your calibration is preserved.

Thanks Elena Mam and Janez sir.