Hello Aklilu,
It seems almost crystalline, however the intensity of the pattern is very low. You must perform a better measurement by increasing the acquisition time. Also, it looks like you have a lot of fluorescence in your xrd. Certainly it will difficult your phase indexation.
Cheers.
In addition to Leonardo Olivieras excellent comment, check the experimental setup. Why is the intensity zero below 11° 2Theta? Was intensity subtracted? How were the data treated? Check your original data, this might be an automatic background subtraction by the phase identification program. If the original data look similar and if this was measured on a Bragg-Brentano geometry, check the sample height. It appears to have been way too high, thus at low 2Thet the primary beam is absorbed by the sample / sample holder.
Once you measure your data again with 10 times the counting time you might be able to interpret this. As I've seen often, the time "saved" with a quick measurement will come back at a multiple factor in the time spent to evaluate the data. With a proper measurement, check the peaks, their shape and keep an ey for the background at low 2Theta. How does this background evolve towards the smallest possible angle on your instrument. Yes, you need to measure this sample starting at 1 or 2° 2Theta. If the background continues to increase toward small angles, you likely have small nanoparticles, thus the apparently broad reflections. If the background drops down at small angles it is an indication that an amorphous phase is present as well.
As it stands, forget this diffraction pattern, unfortunately you cannot learn anything useful due to its lack of quality. Always post original data.
Thanks Leonardo Oliveira and Here is the original data Dr. R. B. Neder
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