As I remember, the proposed background correction just removes inelastic tail without any assumptions about surface structure of sample.
The samples are not homogeneous and their surface layer has elastic properties that are different from elasticity of the main material.
In the following article:
Krastev, R.K. Deformability of contact layers (2018) Journal of Aplied Physical Science International. 10(4), 163-174; ISSN: 2395-5260 (P), ISSN: 2395-5279 (O); Retrieved from http://www.ikpress.org/index.php/JAPSI/article/view/4239
I explain how one can measure this surface effect for samples under compression.
Rumen K. Krastev This is very interesting, but what information do you expect to receive using the "Shirley-Vegh-Salvi-Castle" background correction? How will you take into account the thickness of the outer oxide layers? And finally: the inelastic background from the outer and inner layers has a completely different shape and intensity, so the removal of the background is applicable only for homogeneous samples.
The article cited in my previous answer refers to a technique for measurement of the mechanical diagram (force-displacement) of a base length that contains at least one pair of surface layers (between two compressed bodies), and a method for analyzing this data. As results, it gives information for the non-linear-elastic properties of these surface layers and their depth.
x-ray photoelectron spectroscopy is a different approach, I am not familiar with.
- Badges
- Science topic
- Similar topics
- Correction