Dear Dr. Muralishwara Kakunje,

in order to have an overview (both theoretical and practical) of electron microscopy techniques, I suggest you take a look at the book "Electron Microscopy and Analysis" Peter J. Goodhew, John Humphreys, Richard Beanland Published by Taylor & Francis (2001) available free at: http://www.dmf.unicatt.it/~gavioli/corsi/MSFM/ref/SEM/Electron%20Microscopy%20and%20Analysis%20-%20Goodhew%20-%20Taylor%203rd%202001.pdf

If you need some standard sample for system calibration, you can get some info on the sites:

- https://www.emsdiasum.com/microscopy/products/standards/sem.aspx

- https://www.azom.com/materials-equipment.aspx?cat=233

- http://www.agarscientific.com/sem/calibration-standards

Best regards, Pierluigi Traverso

What Dr. Kakunje mentioned is correct. Purchasing a standard is the best case scenario to very your methodology. I may also suggest Polymer Microscopy text By Linda Sawyer . The text may help you understand sample preparation techniques not always outlined for composite.

Might I also suggest CNT composites as a good standard. There are many papers on these materials and you can most assuredly help expand your skill with them.

Regards

JWH

Dear Muralishwara Kakunje

the evaluation of PNC related to the coating procedure and the properties of your material, for example, the SEM is preferred for some PNCs and the tested sample must be very thin and coated with gold because the high-resolution image magnifications need high voltage to result in an image of three dimensions, which leads to increased temperature, that affects the surface quality of the PNC.

for more details can read:

https://www.sciencedirect.com/topics/engineering/high-resolution-transmission-electron-microscope

Learn more about high resolution transmission electron microscope

Polymer nanocomposite components

SBA-15 is the ideal material for material characterization for TEM , and Various morphology of zeolite and other semiconducting material like various morphology of TiO2, Cu2O and organosilicas (PMOs) for surface morphology characterization of SEM.