I am working on a layer deposition project by plasma focus device. As I didn't study material sciences so far I need a good reference which can help me understanding the surface characterization methods e.g. microscopy techniques like AFM, SEM, .... . I intend to infer which parameters can be calculated or measured via each of the methods.
Also I want to now what is the difference of different microscopy techniques, their excellencies and weaknesses and so on.
Hi Mohammad,
please see the link or 'google' for "surface characterization methods principles techniques and applications". There is a lot of stuff.
Good luck
http://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/20020070606.pdf
Hello Mohammad,
You can take a look at these 3 recent literature on surface characterization:
1. Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods By Clemens Barth
2. Materials Characterization Techniques By Sam Zhang
3. Materials Characterization: Introduction to Microscopic and Spectroscopic methods By Yang Leng
Good luck.
The book from Vickerman and Gilmore is good and cheap:
Surface Analysis - The Principal Techniques, 2nd Edition
Copyright © 2009 John Wiley & Sons, Ltd
Editor(s): John C. Vickerman, Ian S. Gilmore
Published Online: 27 MAR 2009
Print ISBN: 9780470017630
Online ISBN: 9780470721582
DOI: 10.1002/9780470721582
http://onlinelibrary.wiley.com/book/10.1002/9780470721582
Hi Gerhard,
Although googling is the first and fastest option I prefer to use the experts experiences instead because I don't intend to loose much time. Thank you.
Hi Mohammad,
your are right. But often there is the impression that some questioners do not use the internet for a first glance on their subjects. They just 'forget' to 'google'.
Sorry.
But nevertheless asking for dedicated sources is quite welcome of course.
Best regards.
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