In most literature the reverse voltage used in the Pulsed-DC sputtering is mentioned as a method for build-up charge dissipation and thus preventing arcing on the poisoned target surface. The phenomena is relatively straightforward, however, I cannot find any review with calculations showing the impact of the reverse voltage and reverse time duration on the number (at least theoretical) of electron current to the target surface or denisity of positive charge undergoing recombination. Can you recommend any publications related to this subject?

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