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I am using Bruker diamension icon. I would like to measure the surface roughness of ultra-smooth quartz substrate. I tried with Scansyst mode as well as contact mode. Scansyst shows a high force...
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how can i differentiate the resistive switching whether it is uni polar or bipolar from the I-V graph. i plot both i v/s v and log |i| v/s log v. is there any basic difference...?
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Good Evening .... we have an LCR meter (Agilent E4980A, basic) which don't have an in built DC bias option for CV measurement for my device. we have a source meter keithley 238 which can be used...
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i am using keithley 238 with probe station to measure the i-v charactereristics of a ferroelectric thin film. Is it possible to correlate the ferroelectric properties of a thin film by using i-v...
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i am using a sputtering system having one mass flow controller and two needle valves. now i want use argon gas by using Mass flow controller (MFC) for better accuracy. but it is already calibrated...
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