Hello, I am currently looking for a new or used XRD system to analyze sputtering target materials including a wide range of metals, alloys, and metal oxides. I am looking to characterize the material composition, grain structure, and grain size. If anyone has any equipment recommendations and or tips I would appreciate it.
During my Doctor of Engineering research in Japan, I used a Rigaku (Tokyo, Japan) Ultima IV RINT D/max-kA diffractometer with Cu Kα radiation (λ = 1.54178 Å), which can scan sample within very short time and also having analytical software for the sample identification.
Hello Dr. Rahman,
I have used an XRD system at the University of Arizona and from my experience most XRD systems come with some sort of analytical software to identify the peaks in the signal. In your experience are there any specific properties of XRD systems that would increase identification of trace elements in metal and metal oxides samples? Also, does anyone have any experience with larger size samples, I have measured glass slide size samples before but I am really interested in measuring spots on rotary target tubes if possible instead of using dedicated coupons.
If I were you I would contact local sellers and tell them what you do and they will tell you which configuration is the best. Larger samples are not problem you just need to buy system with appropriate stage. You should visit their demo labs with your samples and so on.
I don't think XRD is suitable for trace elements identification.
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