Dear community,

I am working on X-ray photoelectron spectroscopy (XPS) on amorphous silicon carbonitride thin films. My material mostly exists in mixed environments, i.e., silicon bonded to carbon and nitrogen in its local chemical environment as SiC3N. I assume XPS gives only one Si 2p signal from the mixed environment. In a situation like this, is it appropriate to deconvolute the silicon spectra into two peaks corresponding to the Si-C and Si-N bond environment?

If I fit one peak, the residual STD is greater than 1.5. Or should I fit two peaks for Si2p 3/2 and Si2p 1/2 with a spint-orbit splitting energy of 0.6 eV?

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