In the XRD pattern of my samples, one-side broadening of XRD peaks, especially at larger diffraction angles were observed. I need to know the possible reason(s) for that behavior.
Hello respected Dr. Wahba,
Basically, peak asymmetric can be caused by X-ray diffractometer, so you can use a standard powder like silicon ( NIST SRM 640) or other NIST standard samples to see if the peak asymmetry comes from the machine. Peaks at higher angles are less intense compared to that at lower angles, so a slow scan speed is required. One the other hand, anisotropic strain (point defects, dislocations...etc) can cause such asymmetry. You can find more about this issue in the thread and papers attached below.
https://www.researchgate.net/post/What_does_change_of_asymmetry_in_XRD_peaks_with_angle_indicate_about_apparatus
Article Impact of crystalline defects and size on X-ray line broaden...
Article Analysis of asymmetric broadening of X-ray diffraction peak ...
Regards,
Mohammed
Hi, Dr. Adel Maher Wahba
This non-symmetric appearance with your XRD results may be related to the instruments used, type of your samples, Also, the broadening in peaks in the most case considered to the degree of crystallinity, the most important parameter of peak broadening is the microstrain effect which happened at higher theta angles in XRD pattern.
Regards
Hello respected Dr. Wahba,
Basically, peak asymmetric can be caused by X-ray diffractometer, so you can use a standard powder like silicon ( NIST SRM 640) or other NIST standard samples to see if the peak asymmetry comes from the machine. Peaks at higher angles are less intense compared to that at lower angles, so a slow scan speed is required. One the other hand, anisotropic strain (point defects, dislocations...etc) can cause such asymmetry. You can find more about this issue in the thread and papers attached below.
https://www.researchgate.net/post/What_does_change_of_asymmetry_in_XRD_peaks_with_angle_indicate_about_apparatus
Article Impact of crystalline defects and size on X-ray line broaden...
Article Analysis of asymmetric broadening of X-ray diffraction peak ...
Regards,
Mohammed
Thanks a lot Dr. Mohammed M. Obeid. I will check your attached links. It remains to mention that this asymmetric behavior was observed only for such a systems of samples and was absent in almost 300 samples traced on the same instrument. I mean it is not the issue of the instrument. Thanks a lot for your kind help.
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