Let's talk carefully. In XRD you are not measuring any crystalline size directly: you are just measuring the intensity of diffraction as a function of the angle of incidence. Afterwards, you apply a certain model (for instance Scherrer's equation) and, based on the assumptions of the model, you deduce the mean size of the coherent domains. Moreover, that value is the average of thousands or millions of crystallites (depending on the sample and the size of the beam).
On the other hand, in high-resolution TEM, if you are able to see the atomic planes, you can directly measure the crystalline size of that particular crystal. Generally speaking, that value would be different than the coherent domain size deduced from a XRD spectrum.
Let's talk carefully. In XRD you are not measuring any crystalline size directly: you are just measuring the intensity of diffraction as a function of the angle of incidence. Afterwards, you apply a certain model (for instance Scherrer's equation) and, based on the assumptions of the model, you deduce the mean size of the coherent domains. Moreover, that value is the average of thousands or millions of crystallites (depending on the sample and the size of the beam).
On the other hand, in high-resolution TEM, if you are able to see the atomic planes, you can directly measure the crystalline size of that particular crystal. Generally speaking, that value would be different than the coherent domain size deduced from a XRD spectrum.