SEM, TEM, AFM

In order to see the substrate morphology it's better to use AFM TEM SEM and FE-SEM. But for analysing the surface chemistry the contact angle measurement is a good choise.

Atomic Force Microscopy (AFM),

Field Emission Scanning Electron Microscopy (FE-SEM),

Focused Ion Beam – Scanning Electron Microscopy (FIB-SEM),

High Resolution Optical Microscopy (WLIM),

Scanning Transmission Electron Microscopy (STEM),

Transmission Electron Microscopy (TEM),

Ultra High Resolution-SEM (UHR-SEM),

Regards,

Georges