My sample is highly crystalline (already checked with other instrument) transition metal oxide and now I want to use Rigaku Ultima IV diffractometer for its characterization. I want to know which optics (what size of divergent slits, antiscattering slits and recieving slit) are better for its characterization with optimised counts (enhanced intensity). Detector is scintilation counter and Monochromator is used in incident beam path. We are scanning the sample with 1Deg/min speed and getting highest intensity of 300 counts for this sample. Sample stage is rotating round glass plate. We want to enhance the intensity without changing the scan speed.
Please Bhange give me some other details for a best advice:
a) It is a Bragg-Brentano difractometer? b) Which is the size of the sample? c) Do you want to measure the cell parameters? d) It is a cubic cell? e) Are you interested in a whole diffractogramm or only in the high angle ones? f) The line profile is important for your characterization?
Thank you PRofs Chatterjee and Prof Gonzalez.. My samples are polycrystalline powders.. I am using Bragg-Brentano geometry, I need to collect the data for phase identification as well as cell parameter calculation.
If you decrease the size of DS and RS intensity of peaks will drop down but resolution will increase little bit.
For Metal oxides powder BB is good if sample surface is not rough
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