Abdullah ali Flehan

See my answer to a similar question.

https://www.researchgate.net/post/What_is_the_incident_radiation_used_in_XPS_and_why_How_does_the_detector_used_in_the_XPS_differ_from_those_during_SEM_EDX_or_XRD_data_collection?_iepl%5BviewId%5D=3uLr3l5GXKuvcCoTvLue14ev&_iepl%5Bcontexts%5D%5B0%5D=prfiqi&_iepl%5BtargetEntityId%5D=Q%3A646dff1089bb81539707a934&_iepl%5BinteractionType%5D=questionView@

Role of analysis is

XRD : Qualitative and Quantitative analysis of phase and its Crystallographic analysis

EDS: EDS is nothing but energy dsipersive spectrometer for analysi of sample on elemental level , it can analyses the elements after carbon, this normal with SEM which allow the analysis on the microscopic level. XRD analysis is macroscopic level.

FTIR: FTIR spectra used for composition of solids, liquids, and gases.

HR-TEM: I Used to see micro structure in nano range, resolution is far better than SEM.

by knowing the capabilities of the characterization will not serve the purpose...you need to know the interpretation methods and tools for the same...relevant literature study will give insight into he data derived through these characterization. then you need to modify the method to get best results.

These techniques can provide a comprehensive analysis of the microstructural properties of the coating, including its elemental composition (EDS), crystal structure (XRD), molecular structure (FTIR), and atomic arrangement (HR-TEM).

thanks all