It is well known that the resolution of AFM mainly depends on the tip diameter of the cantilever though there are also other factors. For a cantilever having tip radius 10 nm what should be the resolution in ambient conditions?
For AM-AFM the resolution in Z-axis should be in order of Angstroms under certain conditions. However it depends also on the material of the sample. Lateral resolution is much higher, around 10 nm.
Thanks, Tomas.
Please consider the sample to be ideal (film) and other parameters also in good conditions (temp, humidity, quality factor, different noises).
For a tip of radius 10 nm, what is the expected resolution?
(A mathematical explanation will be helpful.)
Based on the structure of material, it can be in order of Angstroms in Z-axis.
Hi Maryam.
It is well known that AFM provides resolution in the range of nanometres. But question is about the expected resolution (precisely) for a tip with 10 nm radius.
Regards,
Pradosh
Hi Pradosh,
Please refer to my Surf. Sci. Rep. review for the detailed explanations about this question.
Y. Gan*, Atomic- and Subnanometer Resolution in Ambient Conditions with Atomic Force Microscope, Surface Science Reports, 64 (2009), 99-121.
Here is the DOI link: http://dx.doi.org/10.1016/j.surfrep.2008.12.001.
This paper can also be downloaded from my RG website.
Hope this helps.
Best,
Yang
http://dx.doi.org/10.1016/j.surfrep.2008.12.001
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