TEM is a technique that uses the interaction of energetic electrons with the sample and provides morphological, compositional and crystallographic information. The electron emitted from filament passes through the multiple electromagnetic lenses and make contact with the screen where the electrons are converted into light and an image is obtained. The speed of electrons is directly related with the electron wavelength and determines the image resolution. A modern TEM is composed of an illumination system, condenser lens system, an objective lens system, magnification system, and the data recording system. A set of condenser lens that focus the beam on the sample and an objective lens collects all the electrons after interacting with the sample and form image of the sample, and determines the limit of image resolution. Finally, a set of intermediate lenses that magnify this image and projects them on a phosphorous screen or a charge coupled device (CCD). TEM can be used for imaging and diffraction mode.

The high-resolution transmission electron microscopy (HRTEM) uses both the transmitted and the scattered beams to create an interference image. It is a phase contrast image and can be as small as the unit cell of crystal. In this case, the outgoing modulated electron waves at very low angles interfere with itself during propagation through the objective lens. All electrons emerging from the specimen are combined at a point in the image plane. HRTEM has been extensively and successfully used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic resolution scale. It can be used for the characterization of point defects, stacking faults, dislocations, precipitates grain boundaries, and surface structures.

To obtain lattice images, a large objective aperture has to be selected that allows many beams including the direct beam to pass. The image is formed by the interference of the diffracted beams with the direct beam (phase contrast). If the point resolution of the microscope is sufficiently high and a suitable crystalline sample oriented along a zone axis, then high-resolution TEM (HRTEM) images are obtained. In many cases, the atomic structure of a specimen can directly be investigated by HRTEM if not the tranverse Electron Microscopy is a TEM one.

I know the obvious and/or self-evident practical and/or pragmatic difference between high resolution and/or 'normal' and/or 'regular' scanning electron microscopy!

TEM is a technique that uses the interaction of energetic electrons with the sample and provides morphological, compositional and crystallographic information. The electron emitted from filament passes through the multiple electromagnetic lenses and make contact with the screen where the electrons are converted into light and an image is obtained. The speed of electrons is directly related with the electron wavelength and determines the image resolution. A modern TEM is composed of an illumination system, condenser lens system, an objective lens system, magnification system, and the data recording system. A set of condenser lens that focus the beam on the sample and an objective lens collects all the electrons after interacting with the sample and form image of the sample, and determines the limit of image resolution. Finally, a set of intermediate lenses that magnify this image and projects them on a phosphorous screen or a charge coupled device (CCD). TEM can be used for imaging and diffraction mode.

The high-resolution transmission electron microscopy (HRTEM) uses both the transmitted and the scattered beams to create an interference image. It is a phase contrast image and can be as small as the unit cell of crystal. In this case, the outgoing modulated electron waves at very low angles interfere with itself during propagation through the objective lens. All electrons emerging from the specimen are combined at a point in the image plane. HRTEM has been extensively and successfully used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic resolution scale. It can be used for the characterization of point defects, stacking faults, dislocations, precipitates grain boundaries, and surface structures.

The basic principle involved in the image formation in both the microscopes is similar, however, HRTEM provides high resolution images at atomic scale level.

You would need HRTEM to find the crystal structure of your material. TEM mode instead gives you more morphological and textural information. In general, a TEM that work at lower kV offer better contrast (but lower resolution) and is sometimes preferred for some biological applications -when you do not look at crystalline material but you are interested in size and morphology.

In contrast, TEM that work at higher kV -those that are designed for HRTEM operation- are preferred for material science. In this case contrast is rarely a problem and the crystal structure is crucial. I hope this helps.

HRTEM and simple TEM is mostly differentiated by their limit of resolution. The HRTEM is an "aberration-corrected" microscopes and has higher power of lattice resolution. In aberration corrector HRTEM one can achieve resolution below 0.5 Angstroms, while in normal 200K TEM mostly resolution achieved is about 2.2 Angstroms.

I think so, and kindly correct if I am wrong.

The high-resolution transmission electron microscopy (HRTEM) uses both the scattered and transmitted beams and the beams to create an interference image. . HRTEM is used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic resolution scale and for the characterization of point defects, dislocations, and surface structures.

TEM is a technique that uses the interaction of energetic electrons with the sample and provides morphological and compositional and crystallographic information. . Modern TEM is composed of an illumination system, condenser lens system, an objective lens system, magnification system, and the data recording system. A set of condenser lens that focus the beam on the sample and an objective lens collects all the electrons after interacting with the sample and form image of the sample, and determines the limit of image resolution. Finally, a set of intermediate lenses that magnify this image and projects them on a phosphorous screen or a charge coupled device (CCD). TEM can be used for imaging and diffraction mode.

Explain clearly and benefited from it so much. Thanks a lot.

 Transmission electron microscopy (TEM) works on the principle of electron diffraction. The discovery of TEM has opened new horizons to visualize material structures far below the resolution reached in light microscopy. TEM is the best tools for directly visualizing the structure, locating and identifying the type of defects and studying structural phase transitions in solids. It has some unique features amongst other micro analytical techniques.The most important feature of TEM is that the wavelength of electrons is much smaller than atomic separations in the solids and thus theoretically it is possible to see crystal details well below the atomic sizes. However the resolution of TEM is limited by spherical and chromatic aberrations of the magnetic lenses used. Looking into its potential to probe materials at nanometer scale, the technological development of TEM has been continued and as a result, today a modern aberration-corrected TEM has a resolving capacity such that it can probe the defect of light element like oxygen with the point resolution of 0.5Å. Overall the beauty of TEM analysis lies in the phrase, ‘seeing is believing’.

New developments for increasing the resolution in high resolution electron microscopy are the use of a monochromator and a Cs corrector to reach point resolutions below 0.5Å, such TEM are these days called HRTEM. The image mode in High-resolution transmission electron microscopy (HRTEM) or (HREM) allows for direct imaging of the atomic structure of the sample.

The second advantage of TEM is electron’s strong atomic scattering factor, which is ~10000 times of that of the x-rays. This gives electron diffraction an advantage to detect even the weakest diffracted spot, which are not possible to detect in powder XRD and NPD. Due to this advantage TEM has become a powerful tool to investigate the crystal symmetry and space groups. But the k-space resolution of electron diffraction is much poorer than XRD.

The basic principle involved in the image formation in both the microscopes is similar, however, HRTEM provides high resolution images and may more magnification compared with TEM so may work at atomic scale level.

I want to know how can you determine the shape  of particles by HRTEM  it seems as collected shapes. is this depend only on your vision or imagination? 

TEM  give the surface shape by scanning it with electron reflection and HRTEM (High Resolution TEM) means a best resolution given by interference of electrons on the material surface it take account of amplitude of the wave of the electron and its phase.The phase add better resoltion which not considered in TEM

thanks for all the above answers.

https://polly.phys.msu.ru/ru/education/courses/Microsc_tech.html

Methods of microscopy of high resolution in researches...

Teachers: associate professor Gallyamov M.O., professor Yaminsky I.V.

Questions on a special course "Methods of microscopy of high resolution in researches of nanomaterials":

1. Optical microscopy: the basic principles, the microscope device, lighting according to Köhler, aberrations, design and specifics of lenses, resolution, an optical limit (the theory to ABBA), a numerical aperture.

2. Optical microscopy: microscopy of phase contrast, principles of phase contrast (Tsernike), phase object, phase plates.

3. Optical microscopy: microscopy of the dark field, principles.

4. Optical microscopy: polarizing microscopy, principles, (phase) plates / compensators, typical images and results.

5. Optical microscopy: microscopy of differential and interferential contrast, principles, Vollaston's prisms.

6. Optical microscopy: microscopy of modulation contrast, principles, modulator (Hoffman's method).

7. Optical microscopy: fluorescent microscopy, the principles, fluorescence, the course of beams in FM, spectral characteristics of sets of filters and fluorofor.

8. Optical microscopy: the laser scanning confocal microscopy, the principles, a confocal diaphragm, 3D scanning of an object.

9. Optical microscopy: the laser scanning microscopy, the multiphoton scheme, its advantages.

10. Optical microscopy: 4π-микроскопия, principles, permission.

11. Optical microscopy: STED microscopy, principles, permission, overcoming optical limit.

12. Optical microscopy: methods of a fluorescent nanoskopiya (RESOLFTs, GSD, SSIM/SPEM, STORM/PALM), general concept, comparison, permission, overcoming optical limit.

Electronic microscopy: the scanning electronic microscopy, the principles, interaction of primary electrons with a sample, the circuitry of the instrument and detectors, secondary electrons (types), backscattered electrons.

13. Electronic microscopy: the analytical scanning electronic microscopy, interaction of a bunch of electrons with sample atoms, the principles of detecting and detectors of x-ray spectroscopy, cards of distribution of elements, diffraction of backscattered electrons, cards of orientation of crystallites.

14. Electronic microscopy: progress in development of methods of the scanning electronic microscopy, thermo - and autoissue cathodes, hardware correction of aberrations, sectioning by the focused ionic bunches (internal structure), low-vacuum microscopy, the researches in situ.

15. Electronic microscopy: preparation of samples for the scanning electronic microscopy (chips, etching, charging problem).

16. Electronic microscopy: translucent electronic microscopy, principles, creation of images of the light field, diffraction of electrons, images of the dark field.

17. Electronic microscopy: the analytical translucent electronic microscopy, the principles, interaction of a bunch of electrons with sample atoms, spectroscopy of characteristic losses of energy electrons, energetically filtered translucent electronic microscopy, cards of distribution of elements.

18. Electronic microscopy: progress in development of methods of the translucent electronic microscopy, thermo - and autoissue cathodes, power filters, hardware correction of aberrations, methods of phase contrast (atomic permission), the mathematical analysis of images, reconstruction of 3D structure (SPA and a tomography), cryo-Pam's advantages (researches in solution), low-vacuum the TEM (dynamics of processes), electronic holography.

19. Electronic microscopy: preparation of samples for the translucent electronic microscopy (etching, an ultramikrotomiya, contrasting).

20. Electronic microscopy: the scanning translucent electronic microscopy, the principles, detectors, permission.

Literature

· D.B. Murphy "Fundamentals of light microscopy and electronic imaging" New York: Wiley-Liss, 2001

· R.F. Egerton "Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM" New York: Springer, 2005

· "Handbook of Microscopy for Nanotechnology" / N. Yao, Zh.L. Wang Eds. Boston: Kluwer Academic Publishers, 2005

· G.H. Michler "Electron Microscopy of Polymers" Berlin: Springer 2008

· L.C. Sawyer, G.T. Grubb, G.F. Meyers "Polymer Microscopy" 3rd ed. New York: Springer, 2008

· P. Echlin "Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis" New York: Springer, 2009

· J. Frank "Microscopy of Macromolecular Assemblies: Visualization of Biological Molecules in Their Native State" Oxford: Oxford University Press, 2006

· LECTURES 6 and 7 - read , please, https://polly.phys.msu.ru/ru/education/courses/Microsc_tech.html

LECTURES:

• Лекция 1
• Лекция 2
• Лекция 3
• Лекция 4
• Лекция 5
• Лекция 6
• Лекция 7

· + read too

· What is the difference between TEM and HRTEM? - ResearchGate

· https://www.researchgate.net/.../What_is_the_difference_bet...

· TEM is a technique that uses the interaction of energetic electrons with the sample and provides morphological, compositional and crystallographic information.

· Pictures for HRTEM method

· ANOTHER pictures for "HRTEM method"

·

· Comparing electron tomography and HRTEM slicing methods as tools ...

· https://www.sciencedirect.com/science/.../S03043991090003...

· аuthor: D Alloyeau - ‎2009 - ‎Цитируется: 32 - ‎Похожие статьи

· In order to demonstrate the reliability and the accuracy of the technique, we have first analyzed the particles in HRTEM. In that case, the particle thickness is ...

· [PDF]

· Chapter 10: High Resolution TEM Imaging

· https://www.its.caltech.edu/~matsci/btf/TEM.../chapter10.pdf

· transmission electron microscope with the method of “high-resolution trans- mission electron microscopy.” Recall (Sect. 2.3.3) that the HRTEM image.

·

· High-Resolution TEM Imaging | SpringerLink

· https://link.springer.com/chapter/10.../978-3-540-73886-2_1...

· author: B Fultz - ‎2008 - ‎

· Spatial resolution is important for any microscopy. This chapter presents the theory, technique, and examples of achieving the ultimate resolution of a ...

·

· HRTEM (High Resolution TEM) and its improvement - Practical ...

· www.globalsino.com/EM/page4310.html

· In this way, the resolution is improved with the multiple beams comparing to ... area electron diffraction method with low index reflections, and HRTEM technique.

·

· HRTEM

· www.elmi.uni-bonn.de/en/sub/forschung/hrtem_e.html

·

· The contrast formation in high resolution TEM (HRTEM) can only be ... In that method the imaging process in the electron microscope is virtually inverted.

·[PDF]

· LATTICE IMAGING IN TRANSMISSION ELECTRON MICROSCOPY

· www.xray.cz/ms/bul2001-1/karlik.pdf

· author: M Karlík - ‎2001 - ‎

· niques in transmission electron microscopy (TEM) is that of (bright-field) ... imaging method is in the difficulty of image interpretation in terms of the atomic ...

High-resolution transmission electron microscopy (HRTEM) (or HREM) is an imaging mode of specialized transmission electron microscopes (TEMs) that allows for direct imaging of the atomic structure of the sample. At present, the highest point resolution realised in phase contrast TEM is around 0.5 ångströms(0.050 nm)

To Sajad Hussain Din:

honestly you should add that you plagiarized a web source without citing that source:

https://en.wikipedia.org/wiki/High-resolution_transmission_electron_microscopy,

where one literally can find:

(quote)

" High-resolution transmission electron microscopy (HRTEM) (or HREM) is an imaging mode of specialized transmission electron microscopes (TEMs) that allows for direct imaging of the atomic structure of the sample.[1][2] HRTEM is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp2-bonded carbon (e.g., graphene, C nanotubes). While HRTEM is often also used to refer to high resolution scanning TEM (STEM, mostly in high angle annular dark field mode), this article describes mainly the imaging of an object by recording the 2D spatial wave amplitude distribution in the image plane, in analogy to a "classic" light microscope. For disambiguation, the technique is also often referred to as phase contrast TEM. At present, the highest point resolution realised in phase contrast TEM is around 0.5 ångströms (0.050 nm).[3] ...... " (End of quote)

Since you omitted selectively text contained in the original (set into BOLD italics by myself) you are put up with criticism of undoubtedly 'intended rip-off'.

Poor scientific behaviour, therefore I withdraw the former given recommendation.

"

thankyou for citing it

the basic difference is the microscale magnification

This answer added honestly just to point to a source which initially wasn't displayed by the author /question respondent (as I found out only today):

In the most popular answer [005] by Nabraj Bhattarai (with 24 recommendations as of Wedn. 2019-09-25) the respondent a text out of an important bookchapter which the respondent created and published as first author in Chapter 3 of:

"Advanced Transmission Electron Microscopy:

Applications to Nanomaterials"

Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal (Eds.)

© SPRINGER Verlag Cham, Heidelberg, etc., © Springer International Publishing Switzerland 2015.

ISBN: 978-3-319-15176-2 eBook: 978-3-319-15177-9

cf.: https://www.springer.com/gp/book/9783319151762.

Chapter 3 [=p. 59-93] by title:

"Advanced Electron Microscopy in the Study of Multimetallic Nanoparticles".

By: Nabraj Bhattarai, S. Khanal, J.J. Velazquez-Salazar, and M. J. Yacamán:

Text of [most popular] answer [005] in this thread can be found in:

Subchapter: 3.3.1 TEM and HRTEM (p. 67)