I would recommend our Raman integrated SEM (RISE) for graphene observation. (http://www.tescan.com/en/other-products/special-products/rise-microscopy)

You can do: White light imaging, Raman mapping and SEM imaging inside one chamber and correlate.

For SEM imaging I would recommend low voltage (

Mr. Vana has absolutely a point that Raman may gives additional information that is otherwise not obvious from SEM data. A nice illustration is given in this article http://dx.doi.org/10.1063/1.4936334 . Integration of Raman with your SEM or dual beam system assures a time effective workflow.

Of course I would recommend a Hybriscan (www.hybriscan.com) over I Witec/Tescan system offering you more flexibility in the choice of your SEM.

SEM focuses on the sample’s surface and its composition only, it shows only the morphology of samples.

TEM provides the details about internal composition, morphology, crystallization, stress or even magnetic domains; so best way to observe the Graphene deposited on copper sheet is TEM. Refer the link http://www.nature.com/ncomms/2014/140902/ncomms5781/full/ncomms5781.html (doi: 10.1038/ncomms5781)

I will not argue here with Mr Wolthuis,

but i have to say Tescan has the most flexible microscopes on the market, so the argument on SEM flexibility is inappropriet.