Hi everybody, we are currently revising our manuscript about semi-conductor photocatalyst.
Our photocatalyst is a binary system, one of the component was in multilayer structure. We already confirmed the microstructure by SEM and TEM images.
One of the reviewer suggest us to provide the AFM image of both two component in our sample. Is that means I need determine the single layer thickness?
Thank you for your time!
From your description what I understand is one component of your photocatalyst is in the form of a multilayered thin film, and the second component of photocatalyst is distributed on this thin film. Probably, the reviewer wants to know the surface topography of this second component along with the topography of the thin film.
I do not think the reviewer wants you to measure layer thickness using AFM.
Krishnan Raja
Dear Prof. Krishnan Raja
Thank you for your answer.
I agree with your answer, but that need AFM image of composite. While reviewer highlighted that we need provide AFM image of single component but not composite, that's really confusing.
Shall I provide both single phase AFM images and composite AFM image?
Yes, show the AFM image of the composite and zoom in the topography of single phase to reveal the interface of these two phases. I guess that the reviewer wants to know the details of the interface using AFM. All the best with your revised manuscript!
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