The figures attached are XRD patterns measured from the same compound doped at different concentration (1 - 8 mol%). When observed carefully it can be seen that there is a reversal of peak intensities. The peak at 30 deg. is much stronger for the 5 mol% doping (and all the other samples except the 6 mol% sample), but at 6 mol% doping, the peaks at higher angles have higher intensities. What can be the best probable explanation for this?
Hi Iorkyaa,
I think you suffer from artifacts of the orientational distribution of your crystallites in your sample .
I don't think that you have taken the same sample, which after doping you have replaced exactly at the very same position in your x-ray set up. So I guess you have got different individual sample and you compare their XRD peak heights.
Thanks Martens, this could have been true except that this same sample show different behavior under PL measurement. Moreover, all samples are loaded linearly in the XRD machine. But I shall repeat the measurement to cross-check if indeed it was artifacts.
Proper grinding of your powder is also important to eliminate some artifacts. Is your sample spinning?
The change in intensity is most likely due to orientation not due to the doping. If you consider the difference in scattering factors of the 5mol% and 6mol% doped samples you will realize that this will not explain the change in intensities. If you material has a crystallites of a defined shape (rods, plates,..) they will orient in a preferred way if the material has not been ground properly which in turn will lead to a change in the relative intensities of the shown reflections.
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