I used W-H method to find dislocation density for SPD processed samples and also subtract instrumental broadening. I got the DD in the order of 10^14-10^15.
One of the limitation of XRD is required regular Calibration, we have to check and recalibrate (based on your samples) before measuring our specimens. Keep in mind that, this is the line profile analysis techniques.
Other than this, first observe using TEM, EBSD and estimate your dislocation density using XRD. It is all about estimations, it may not take time as of TEM and EBSD as you may know. You can also compare your results from all instruments (TEM, EBSD, and XRD) and observe the repeatability of XRD results. X-ray diffraction measurements is an in situ techniques having numerous advantages for dislocation density.
For Calibration refere this... and
For XRD limitations and concern, you may read and get some facts from this thesis.
Ribárik G. Modeling of diffraction patterns based on
microstructural properties. [Thesis]. Budapest: Eötvös Loránd
University; 2008
For TEM and XRD result refere this
Good luck!
In springer paper, you have not mention the dislocation density using TEM.
Dislocation density measurement of SPD material through TEM is very difficult as TEM focus very small area and it gives only localized value. Therefore, people are extended the XRD technique for DD measurement.
Dear Changela,
I have observed the dislocation density using TEM and HR-EBSD for a comparison study of CYR and CLR AA5083 alloys. In Fact, I did prefer X-RD for quantification.
If you have time you can read the thesis which I have mentioned along with http://iitd.ac.in/content/fitsum-taye-feyissa-11102018, I hope you have access to both. Or else, you may clarify your topics or research objective (article) for a specific answer. Then we can all participate and share our experiences.
Regards,
Thank you fitsum.sure, i will see your thesis and try to understand
- Badges
- Science method
- Similar topics
- Methodology
- Crystallography
- X-ray Diffraction