I want to observe the surface of a sample in situ at different temperatures. Is it possible to take surface images at a particular temperature (mainly cryogenic temperatures)? If not, what in situ temperature dependent characterization techniques can be used to study the material structure instead? Surface analysis in terms of material structure, morphology, imaging or anything that I can do temperature dependent will work. My samples are thin films on glass substrates. Liquid Nitrogen temperature is enough, I don't really need to go down to liquid Helium temperature.
There are plenty of preparation chambers for XPS (ESCA). This will provide surface composition and oxidation state information. I assume you either have access to an XPS instrument or have access to a few hundreds of thousands of dollars for such an instrument. However, I am confused at your statement of taking images - are you looking to electron microscopy or AFM?. If you're looking for structure then XRD provides the best route - again sample preparation chambers are available. Again these tend to be expensive (at least in relation to an ice cream).
As Alan F Rawle Sir mentioned, the availability and the cost of such techniques are the main issues, However, to have an idea about the cryogenic imaging techniques, please make a search in Google about the followings:
- Scanning electron cryomicroscopy (CryoSEM)
- Transmission electron cryomicroscopy (CryoTEM)
- Electron cryotomography (CryoET)
- Cryogenic AFM-STM for mesoscopic
There's a cryo-EM standard (written by FDA personnel) from the E56.02 Characterization sub (which I CoChair) of E56 Committee on Nanotechnology:
ASTM E3143 - 18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
It's an excellent primer document.
Surface analysis in terms of material structure, morphology, imaging or anything that I can do temperature dependent will work.
Dear Muhammad,
It would help if you can be a bit more precise - what are you interested in, what kind of samples (powders, thin films, particles, polycrystalline, single crystals, etc) and materials (elements) you are dealing with. Especially all kinds of photon-in - photon out techniques are available for all kinds of environments, not only but also for ultrahigh vacuum conditions. And then the temperature scale is important, is liquid niotrogen (77 K) enough, or do you need Helium temperature (4 K) or even less? this is all important to give more concrete answers! Cheers to all, Dirk
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Dear Muhammad Farooq Saleem ,
Infrared thermography can be a good idea. It is a technique dedicated to the acquisition and processing of thermal information from non-contact measurement devices.
Georges Gebrayel El Reaidy It seems that you have not read the question thoroughly....
Alan F Rawle , I do not want to say anything, but please find a fair way to raise the number of answers!
Regards,
Georges Gebrayel El Reaidy
My samples are thin films on glass substrates. Liquid Nitrogen temperature is enough, I don't really need to go down to liquid Helium temperature .
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