I am performing force spectroscopy (FS) on PVDF nanofibers using the Nanosurf's FlexAFM system at room temperature. My experimental parameters are:

• Tip travel range: 1 µm
• Modulus acquisition time: 1 s
• Data points: 1024
• Measurement grid: 36 × 36 (total 1296 indentations)
• Loading force range: 1–2 µN

The issue I am facing is significant drift or lateral movement of the fiber after each FS measurement. As a result, the subsequent FS data often only maps the substrate, not the nanofiber itself. To compensate, I have to stop the measurement, do a new topography scan, and then realign—however, in most cases, the region of interest shifts and is no longer the same. This is compromising the consistency and reliability of my data.

Has anyone encountered a similar issue while performing FS on 1D soft or flexible nanostructures? Are there specific strategies or system settings that can help reduce drift or fiber displacement during large FS mapping scans?

Any suggestions or insights would be greatly appreciated. Thank you!